
德國SARAD離子注入式半導體探頭AS硅探測器
離子注入式半導探測器AS用于α/β能譜測量的離子深度注入硅探測器,作為OEM部件及應用于輻射測量儀器。
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描述
產(chǎn)品名稱:離子注入式半導體探頭
品牌:SARAD
產(chǎn)地:德國
型號:AS

離子注入式半導體探測器AS的特點包括牢固設計、低本底、并且即使工作在低電壓環(huán)境下依然具有優(yōu)異的光譜性能;僅需10?V偏置電壓,探測器即可將α粒子(**10?MeV)的全部能量沉積在耗盡層內(nèi);特別為β粒子測量設計的BS型探頭,其耗盡層深度可達500?µm。
離子注入式半導體探頭AS既可在一般環(huán)境又可在真空條件下精確測量。 入射窗涂有用于保護探頭的50?nm(V型)或500?nm(E型)超薄鋁涂層,鋁涂層更厚的E型探頭特別適合于環(huán)境測量。
離子注入式半導體探頭AS采用Microdot接口(工業(yè)標準),保證了其具有與其它制造商儀器的良好兼容性,可選BNC和SMA接口型。
中文內(nèi)容來自機器翻譯,內(nèi)容僅供參考,實際內(nèi)容可參考原廠介紹或以合同為準。
英文原文:
Ion-implanted silicon detectors for alpha spectroscopy
SARAD manufactures ion implanted silicon detectors for the alpha/beta spectroscopy since 1994. SARAD detectors have been approved for thousand times as OEM parts or inside our radiation detection equipment.
Key features are the robust design, low background and the outstanding spectroscopic performance even at low bias voltages. Only a 10 volts bias is required to deposit the whole emission energy of an alpha particle (up to 10?MeV) within the depletion layer. The BS types, especially designed for beta detection, provide a depleted region of 500?µm.
All types can be used under ambient conditions as well as in vacuum gauges. The entrance window is protected by an thin aluminium layer with a thickness of 50?nm (type V) or 500?nm (type E). The thicker aluminium of the E type detectors make them especially suitable for ambient light applications.
The detectors are delivered with a Microdot jack (industry standard) to guarantee the full compatibility with other manufacturers. BNC or SMA type jacks are optionally available.
品牌:SARAD
產(chǎn)地:德國
型號:AS


德國SARAD離子注入式半導體探頭AS介紹:
離子注入式半導探測器AS用于α/β能譜測量的離子深度注入硅探測器,作為OEM部件及應用于輻射測量儀器。離子注入式半導體探測器AS的特點包括牢固設計、低本底、并且即使工作在低電壓環(huán)境下依然具有優(yōu)異的光譜性能;僅需10?V偏置電壓,探測器即可將α粒子(**10?MeV)的全部能量沉積在耗盡層內(nèi);特別為β粒子測量設計的BS型探頭,其耗盡層深度可達500?µm。
離子注入式半導體探頭AS既可在一般環(huán)境又可在真空條件下精確測量。 入射窗涂有用于保護探頭的50?nm(V型)或500?nm(E型)超薄鋁涂層,鋁涂層更厚的E型探頭特別適合于環(huán)境測量。
離子注入式半導體探頭AS采用Microdot接口(工業(yè)標準),保證了其具有與其它制造商儀器的良好兼容性,可選BNC和SMA接口型。
德國SARAD離子注入式半導體探頭AS參數(shù):

中文內(nèi)容來自機器翻譯,內(nèi)容僅供參考,實際內(nèi)容可參考原廠介紹或以合同為準。
英文原文:
Ion-implanted silicon detectors for alpha spectroscopy
SARAD manufactures ion implanted silicon detectors for the alpha/beta spectroscopy since 1994. SARAD detectors have been approved for thousand times as OEM parts or inside our radiation detection equipment.
Key features are the robust design, low background and the outstanding spectroscopic performance even at low bias voltages. Only a 10 volts bias is required to deposit the whole emission energy of an alpha particle (up to 10?MeV) within the depletion layer. The BS types, especially designed for beta detection, provide a depleted region of 500?µm.
All types can be used under ambient conditions as well as in vacuum gauges. The entrance window is protected by an thin aluminium layer with a thickness of 50?nm (type V) or 500?nm (type E). The thicker aluminium of the E type detectors make them especially suitable for ambient light applications.
The detectors are delivered with a Microdot jack (industry standard) to guarantee the full compatibility with other manufacturers. BNC or SMA type jacks are optionally available.
提示:“德國SARAD品牌AS產(chǎn)品”內(nèi)容及圖片來自廠商官網(wǎng)、翻譯或互聯(lián)網(wǎng)引用等,內(nèi)容僅供參考,以最終簽訂合同為準,如有差錯或異議可聯(lián)系我們更改。